Introduction to advanced system on chip test design and optimization pdf

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introduction to advanced system on chip test design and optimization pdf

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System-on-Chip Test Scheduling and Test Infrastructure Design

Skip to search form Skip to main content You are currently offline. Some features of the site may not work correctly. Larsson Published Engineering. There are several challenges that have to be considered in order to reduce the cost of System-on-Chip SoC testing, such as test application time, chip area overhead due to hardware introduced to enhance the testing, and the price of the test equipment. In this thesis the test application time and the test infrastructure hardware overhead of multiple-core SoCs are considered and two different problems are addressed.

It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA electronic design automation tools. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling. Finally, the third part focuses on SOC applications, such as integrated test scheduling and TAM design, defect-oriented scheduling, and integrating test design with the core selection process. Skip to main content Skip to table of contents.

This content was uploaded by our users and we assume good faith they have the permission to share this book. If you own the copyright to this book and it is wrongfully on our website, we offer a simple DMCA procedure to remove your content from our site. Start by pressing the button below! Maston, T. Taylor, J. Benso, P. Bushnell, V.

System-on-Chip Test Scheduling and Test Infrastructure Design

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SOC test design and its optimization is the topic of Introduction to Advanced DRM-free; Included format: PDF; ebooks can be used on all reading devices.


Introduction to Advanced System-on-Chip Test Design and Optimization

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Introduction to Advanced System-on-Chip Test Design and Optimization

It gives an introduction to testing, describes the problems related to SOC testing, discusses the modeling granularity and the implementation into EDA electronic design automation tools. The first part covers an introduction into test problems including faults, fault types, design-flow, design-for-test techniques such as scan-testing and Boundary Scan. The second part of the book discusses SOC related problems such as system modeling, test conflicts, power consumption, test access mechanism design, test scheduling and defect-oriented scheduling.

COMMENT 4

  • Testing of Integrated Circuits is important to ensure the production of fault-free chips. Amelia R. - 24.03.2021 at 05:23
  • SOC test design and its optimization is the topic of Introduction to Advanced System-on-Chip Test Design and Optimization. It gives an introduction to testing,​. Yolande G. - 24.03.2021 at 10:11
  • Motivation, design, programming, optimization, and use of modern System-on-a-Chip SoC architectures. Andrea S. - 27.03.2021 at 18:08
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